Hu GX, Gong H, Chor EF, Wu P, Properties of p-type and n-type ZnO influenced by P concentration, APPLIED PHYSICS LETTERS 89 (25): Art. No. 251102 DEC 18 2006
Kumar B, Gong H, Vicknesh S, Chua SJ, Tripathy S, Luminescence properties of ZnO layers grown on Si-on-insulator substrates, APPLIED PHYSICS LETTERS 89 (14): Art. No. 141901 OCT 2 2006
Hu GX, Gong H, Chor EF, Wu P, ZnO homojunctions grown by cosputtering ZnO and Zn3P2 targets, APPLIED PHYSICS LETTERS 89 (2): Art. No. 021112 JUL 10 2006
Kumar B, Gong H, Chow SY, Tripathy S, Hua YN, Photoluminescence and multiphonon resonant Raman scattering in low-temperature grown ZnO nanostructures, APPLIED PHYSICS LETTERS 89 (7): Art. No. 071922 AUG 14 2006
Gong H, Hu JQ, Wang JH, Ong CH, Zhu FR, Nano-crystalline Cu-doped ZnO thin film gas sensor for CO, SENSORS AND ACTUATORS B-CHEMICAL 115 (1): 247-251 MAY 23 2006
Yu ZG, Wu P, Gong H, Control of p- and n-type conductivities in P doped ZnO thin films by using radio-frequency sputtering, APPLIED PHYSICS LETTERS 88 (13): Art. No. 132114 MAR 27 2006
Hu GX, Kumar B, Gong H, Chor EF, Wu P Transparent indium zinc oxide ohmic contact to phosphor-doped n-type zinc oxide, APPLIED PHYSICS LETTERS 88 (10): Art. No. 101901 MAR 6 2006.
Kumar B, Gong H, Gosvami NN, Akkipeddi R, O'Shea SJ Nanoscaled electrical homogeneity of indium zinc oxide films, APPLIED PHYSICS LETTERS 88 (9): Art. No. 093111 FEB 27 2006
Yu ZG, Gong H, Wu P Lattice dynamics and electrical properties of wurtzite ZnO determined by a density functional theory method
JOURNAL OF CRYSTAL GROWTH 287 (1): 199-203 JAN 18 2006
Liu L, Bai KW, Gong H, Wu P First-principles study of bipolar dopability in the CuInO2 transparent semiconductor CHEMISTRY OF MATERIALS 17 (22): 5529-5537 NOV 1 2005
Kumar B, Gong H, Akkipeddi R High mobility undoped amorphous indium zinc oxide transparent thin films JOURNAL OF APPLIED PHYSICS 98 (7): Art. No. 073703 OCT 1 2005
Liu L, Bai K, Gong H, Wu P First-principles study of Sn and Ca doping in CuInO2 PHYSICAL REVIEW B 72 (12): Art. No. 125204 SEP 2005
Cai JL, Gong H The influence of Cu/Al ratio on properties of chemical-vapor-deposition-grown p-type Cu-Al-O transparent semiconducting films JOURNAL OF APPLIED PHYSICS 98 (3): Art. No. 033707 AUG 1 2005
Yu ZG, Gong H, Wu P Study on anomalous n-type conduction of P-doped ZnO using P2O5 dopant source APPLIED PHYSICS LETTERS 86 (21): Art. No. 212105 MAY 23 2005
Lin GQ, Gong H, Wu P Electronic properties of barium chalcogenides from first-principles calculations: Tailoring wide-band-gap II-VI semiconductors PHYSICAL REVIEW B 71 (8): Art. No. 085203 FEB 2005
Kumar B, Gong H, Akkipeddi R A study of conduction in the transition zone between homologous and ZnO-rich regions in the In2O3-ZnO system JOURNAL OF APPLIED PHYSICS 97 (6): Art. No. 063706 MAR 15 2005
Yu ZG, Gong H, Wu P Dopant sources choice for formation of p-type ZnO Phosphorus compound sources CHEMISTRY OF MATERIALS 17 (4): 852-855 FEB 22 2005
Hu JQ, Pan JS, Zhu FR, Gong H, Evidence of nitric-oxide-induced surface band bending of indium tin oxide, JOURNAL OF APPLIED PHYSICS 95 (11): 6273-6276 Part 1, JUN 1 2004
Hu JQ, Zhu FR, Zhang J, Gong H, A room temperature indium tin oxide/quartz crystal microbalance gas sensor for nitric oxide, SENSORS AND ACTUATORS B-CHEMICAL 93 (1-3): 175-180 AUG 1 2003
Ho MY, Gong H, Wilk GD, Busch BW, Green ML, Lin WH, See A, Lahiri SK, Loomans ME, Raisanen PI, Gustafsson T, Suppressed crystallization of Hf-based gate dielectrics by controlled addition of Al2O3 using atomic layer deposition, APPLIED PHYSICS LETTERS 81 (22): 4218-4220 NOV 25 2002
Zhang LH, Gong H, Wang JP, Kinetics and mechanisms of the thermal degradation of amorphous carbon films, JOURNAL OF APPLIED PHYSICS 91 (12): 9646-9651 JUN 15 2002
Lee CS, Gong H, Liu R, Wee ATS, Cha CL, See A, Chan L, Study of copper silicide retardation effects on copper diffusion in silicon, JOURNAL OF APPLIED PHYSICS 90 (8): 3822-3824 OCT 15 2001
Liu L, Wang Y, Gong H, Annealing effects of tantalum films on Si and SiO2/Si substrates in various vacuums, JOURNAL OF APPLIED PHYSICS 90 (1): 416-420 JUL 1 2001
Gong H, Wang Y, Luo Y, Nanocrystalline p-type transparent Cu-Al-O semiconductor prepared by chemical-vapor deposition with Cu(acac)(2) and Al(acac)(3) precursors, APPLIED PHYSICS LETTERS 76 (26): 3959-3961 JUN 26 2000
Yap KP, Gong H, Dai JY, Osipowicz T, Chan LH, Lahiri SK Integrity of copper-tantalum nitride metallization under different ambient conditions JOURNAL OF THE ELECTROCHEMICAL SOCIETY 147 (6): 2312-2318 JUN 2000
Cha CL, Tee KC, Chor EF, Gong H, Prasad K, Bourdillon AJ, See A, Chan L, Lee MMO Enhancement of hot-carrier injection resistance for deep submicron transistor gate dielectric with a powered solenoid APPLIED PHYSICS LETTERS 75 (26): 4192-4194 DEC 27 1999
Cha CL, Chor EF, Gong H, Bourdillon AJ, Jia YM, Pan JS, Zhang AQ, Chan L Surface smoothing of floating gates in flash memory devices via surface nitrogen and carbon incorporation, APPLIED PHYSICS LETTERS 75 (3): 355-357 JUL 19 1999
Gong H, Wang YJ, Teo SC, Huang L, Interaction between thin-film tin oxide gas sensor and five organic vapors, SENSORS AND ACTUATORS B-CHEMICAL 54 (3): 232-235 MAR 9 1999
Gong H, Theory and computation for imaging in scanning-transmission microscopy considering partial coherence in illumination, ULTRAMICROSCOPY 55 (4): 373-381 OCT 1994
Gong H, LeGressus C, Oh KH, Ding XZ, Ong CK, Tan BTG, Charge trapping on different cuts of a single-crystalline alpha-SiO2, JOURNAL OF APPLIED PHYSICS 74 (3): 1944-1948 AUG 1 1993
Gong H, Schapink FW Foil-thickness determination from zone-axis CBED patterns and TEM images for a GaAs/AlAs multilayer inplan view, ULTRAMICROSCOPY 41 (4): 375-385 JUN 1992
Gong H, Schapink FW, Fine details in satellite HOLZ reflection disks of CBED from a GaAs/AlAs multilayer, ULTRAMICROSCOPY 35 (3-4): 171-184 JUN 1991
Gong H Fast computer simulation of transmission electron-microscope images showing one-dimensional features and the effects of finite extent of the source on the images NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT 298 (1-3): 283-288 DEC 1 1990
Morrison GR, Gong H, Chapman JN, Hrnclar V, The measurement of narrow domain-wall widths in SmCo5 using differential phase-contrast electron microscopy, JOURNAL OF APPLIED PHYSICS 64 (3): 1338-1342 AUG 1 1988
Gong H, Chapman JN On the use of divergent wall images in the Fresnel mode of Lorentz microscopy for the measurement of the widths of very narrow domain walls JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS 67 (1): 4-8 MAY 1987
Transparent Oxide Semiconductor and Nano-semiconductor Thin Films and Properties
